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[IEEE Proceedings. 2006 International Conference on Design and Test of Integrated Systems in Nanoscale Technology - Tunis (2006.09.5-2006.09.7)] International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. - Analysis of CNTFET physical compact model

โœ Scribed by Maneux, C.; Goguet, J.; Fregonese, S.; Zimmer, T.; Cazin d'Honincthun, H.; Galdin-Retailleau, S.


Book ID
120266779
Publisher
IEEE
Year
2006
Tongue
English
Weight
444 KB
Category
Article
ISBN-13
9780780397262

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