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✦ LIBER ✦

[IEEE International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. - Tunis, Tunisia (2006.09.5-2006.09.7)] International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. - Supply voltage glitches effects on CMOS circuits

✍ Scribed by Djellid-Ouar, A.; Cathebras, G.; Bancel, F.

Book ID: 126754662
Publisher: IEEE
Year: 2006
Weight: 465 KB
Category: Article
ISBN-13: 9780780397262
DOI: 10.1109/DTIS.2006.1708651

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