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[IEEE International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. - Tunis, Tunisia (2006.09.5-2006.09.7)] International Conference on Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. - Dual band CMOS LNA design with current reuse topology

โœ Scribed by Ben Amor, M.; Fakhfakh, A.; Mnif, H.; Loulou, M.


Book ID
118169233
Publisher
IEEE
Year
2006
Weight
796 KB
Volume
0
Category
Article
ISBN-13
9780780397262

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