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[IEEE Proceedings 1998 IEEE Hong Kong Electron Devices Meeting - Hong Kong (1998.08.29-1998.08.29)] Proceedings 1998 Hong Kong Electron Devices Meeting (Cat. No.98TH8368) - Study of flicker noise in III-V nitride based heterojunctions due to hot-electron stressing

✍ Scribed by Ho, W.Y.; Surya, C.

Book ID: 126607266
Publisher: IEEE
Year: 1998
Weight: 300 KB
Category: Article
ISBN-13: 9780780349322
DOI: 10.1109/HKEDM.1998.740194

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