𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Multi-Physics simulation and Experiments in Microelectronics - Freiburg im Breisgau, Germany (2008.04.20-2008.04.23)] EuroSimE 2008 - International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems - Electromigration induced failure mechanism: Multiphysics model and correlation with experiments

✍ Scribed by Cacho, F.; Fiori, V.; Doyen, L.; Chappaz, C.; Tavernier, C.; Jaouen, H.

Book ID: 121716407
Publisher: IEEE
Year: 2008
Weight: 684 KB
Category: Article
ISBN: 1424421284
DOI: 10.1109/esime.2008.4525025

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