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[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Contribution of device simulation to SER understandfng

✍ Scribed by Palau, J.-M.; Calvet, M.-C.; Dodd, P.E.; Sexton, F.W.; Roche, P.

Book ID: 118153132
Publisher: IEEE
Year: 2003
Weight: 360 KB
Volume: 0
Category: Article
ISBN-13: 9780780376496
DOI: 10.1109/relphy.2003.1197723

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