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[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup

✍ Scribed by Weger, A.; Voldman, S.; Stellari, F.; Peilin Song, ; Pia Sanda, ; McManus, M.

Book ID: 111683845
Publisher: IEEE
Year: 2003
Weight: 487 KB
Volume: 0
Category: Article
ISBN-13: 9780780376496
DOI: 10.1109/relphy.2003.1197727

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