[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - FIB-induced deposition of conducting material with intermediate resistivity for design debugging

✍ Scribed by Gu, G.Y.; Bassom, N.J.; Casey, J.D.; Scipioni, L.; Saxonis, A.; Huynh, C.

• Book ID: 118214528
• Publisher: IEEE
• Year: 2003
• Weight: 79 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780376496
• DOI: 10.1109/relphy.2003.1197820