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[IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA (October 24-27, 1993)] International Integrated Reliability Workshop Final Report - An Investigation of Key Factors in the Manufacturability and Qualification of Known Good Die Processes

✍ Scribed by Vanoverloop, D.; Walker, S.

Book ID: 126745817
Publisher: IEEE
Year: 1993
Weight: 761 KB
Category: Article
DOI: 10.1109/IRWS.1993.666305

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