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[IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA (October 24-27, 1993)] International Integrated Reliability Workshop Final Report - Thermal Analysis of DLBI (Die Level Burn In) Carrier

✍ Scribed by Park, M.; Khalil, W.

Book ID: 126767447
Publisher: IEEE
Year: 1993
Weight: 132 KB
Category: Article
DOI: 10.1109/IRWS.1993.666313

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