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[IEEE IEEE 1995 International Integrated Reliability Workshop. Final Report - Lake Tahoe, CA, USA (22-25 Oct. 1995)] IEEE 1995 International Integrated Reliability Workshop. Final Report - A new approach for predicting AC hot carrier lifetime

✍ Scribed by Kato, H.

Book ID: 121527153
Publisher: IEEE
Year: 1995
Tongue: English
Weight: 539 KB
Category: Article
ISBN-13: 9780780327054
DOI: 10.1109/IRWS.1995.493586

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