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[IEEE IEEE 1995 International Integrated Reliability Workshop. Final Report - Lake Tahoe, CA, USA (22-25 Oct. 1995)] IEEE 1995 International Integrated Reliability Workshop. Final Report - A case study in a 100×reduction in sodium ions in a 0.8 μm BiCMOS process using triangular voltage sweep

✍ Scribed by Anderson, L.; Parikh, S.; Nagalingam, S.; Haidinyak, C.

Book ID: 126751489
Publisher: IEEE
Year: 1995
Weight: 467 KB
Category: Article
ISBN-13: 9780780327054
DOI: 10.1109/IRWS.1995.493574

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