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[IEEE 2003 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (20-23 Oct. 2003)] IEEE International Integrated Reliability Workshop Final Report, 2003 - Using time-dependent reliability fallout as a function of yield to optimize burn-in time for a 130 nm SRAM device

✍ Scribed by Forbes, K.R.; Arguello, N.

Book ID: 120015066
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 435 KB
Category: Article
ISBN-13: 9780780381575
DOI: 10.1109/IRWS.2003.1283302

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