[IEEE 2003 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (20-23 Oct. 2003)] IEEE International Integrated Reliability Workshop Final Report, 2003 - Dielectric reliability studies of metal insulator metal capacitors (MIMCAP) with SiN dielectric under unipolar to bipolar AC-stress

✍ Scribed by Schwab, R.; Allers, K.H.

• Book ID: 118207698
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 309 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780381575
• DOI: 10.1109/irws.2003.1283306