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[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Low field mobility of ultra-thin SOI N- and P-MOSFETs: Measurements and implications on the performance of ultra-short MOSFETs

✍ Scribed by Esseni, D.; Mastrapasqua, M.; Celler, G.K.; Baumann, F.H.; Fiegna, C.; Selmi, L.; Sangiorgi, E.

Book ID: 120664069
Publisher: IEEE
Year: 2000
Weight: 359 KB
Edition: 2000
Category: Article
ISBN-13: 9780780364387
DOI: 10.1109/IEDM.2000.904408

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