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[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Explanation and quantitative model for the matching behaviour of poly-silicon resistors

✍ Scribed by Thewes, R.; Brederlow, R.; Dahl, C.; Kollmer, U.; Linnenbank, C.G.; Holzapfl, B.; Becker, J.; Kissing, J.; Kessel, S.; Weber, W.

Book ID: 118164838
Publisher: IEEE
Year: 1998
Weight: 530 KB
Volume: 0
Category: Article
ISBN-13: 9780780347748
DOI: 10.1109/iedm.1998.746470

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