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[IEEE International Electron Devices Meeting 1991 [Technical Digest] - Washington, DC, USA (8-11 Dec. 1991)] International Electron Devices Meeting 1991 [Technical Digest] - Switching behavior and current handling performance of MCT:IGBT cell ensembles

✍ Scribed by Lendenmann, H.; Dettmer, H.; Fichtner, W.; Baliga, B.J.; Bauer, F.; Stockmeier, T.

Book ID: 111973435
Publisher: IEEE
Year: 1991
Weight: 275 KB
Volume: 0
Category: Article
ISBN-13: 9780780302433
DOI: 10.1109/iedm.1991.235479

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