[IEEE International Electron Devices Meeting 1991 [Technical Digest] - Washington, DC, USA (8-11 Dec. 1991)] International Electron Devices Meeting 1991 [Technical Digest] - The effect of metallic impurities on the dielectric breakdown of oxides and some new ways of avoiding them

✍ Scribed by Verhaverbeke, S.; Meuris, M.; Mertens, P.W.; Heyns, M.M.; Philipossian, A.; Graf, D.; Schnegg, A.

• Book ID: 118058961
• Publisher: IEEE
• Year: 1991
• Weight: 367 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780302433
• DOI: 10.1109/iedm.1991.235421