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[IEEE International Electron Devices Meeting. Technical Digest - San Francisco, CA, USA (8-11 Dec. 1996)] International Electron Devices Meeting. Technical Digest - Channel profile optimization and device design for low-power high-performance dynamic-threshold MOSFET

โœ Scribed by Wann, C.; Assaderaghi, F.; Dennard, R.; Chenming Hu, ; Shahidi, G.; Taur, Y.


Book ID
111958825
Publisher
IEEE
Year
1996
Weight
370 KB
Volume
0
Category
Article
ISBN-13
9780780333932

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[IEEE IEDM Technical Digest. IEEE Intern