𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - An optimization approach for safety instrumented system design

✍ Scribed by Machleidt, Konstantin; Litz, Lothar

Book ID: 121852883
Publisher: IEEE
Year: 2011
Weight: 402 KB
Category: Article
ISBN: 1424488575
DOI: 10.1109/RAMS.2011.5754503

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Advanced models for software reliability prediction

✍ Bluvband, Zigmund; Porotsky, Sergey; Talmor, Michael 📂 Article 📅 2011 🏛 IEEE ⚖ 386 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Design of reliability demonstration testing for repairable systems

✍ Guo, Huairui; Liao, Haitao; Gerokostopoulos, Athanasios; Mettas, Adamantios 📂 Article 📅 2011 🏛 IEEE ⚖ 415 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Model-driven automated software FMEA

✍ Snooke, Neal; Price, Chris 📂 Article 📅 2011 🏛 IEEE ⚖ 729 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Reliability growth planning for discrete-use systems

✍ Hall, J. Brian 📂 Article 📅 2011 🏛 IEEE ⚖ 563 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - System reliability assessment as components undergo accelerated testing

✍ Luo, Wei; Zhang, Chun-hua; Tan, Yuan-yuan; Chen, Xun 📂 Article 📅 2011 🏛 IEEE ⚖ 361 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - An improved modular approach for dynamic fault tree analysis

✍ Yevkin, Olexandr 📂 Article 📅 2011 🏛 IEEE ⚖ 451 KB