𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - An improved modular approach for dynamic fault tree analysis

✍ Scribed by Yevkin, Olexandr

Book ID: 125545358
Publisher: IEEE
Year: 2011
Weight: 451 KB
Category: Article
ISBN: 1424488575
DOI: 10.1109/RAMS.2011.5754437

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - A method of quantitative analysis for dynamic fault tree

✍ Zhang, Hong-Lin; Zhang, Chun-Yuan; Liu, Dong; Li, Rui 📂 Article 📅 2011 🏛 IEEE ⚖ 482 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Advanced models for software reliability prediction

✍ Bluvband, Zigmund; Porotsky, Sergey; Talmor, Michael 📂 Article 📅 2011 🏛 IEEE ⚖ 386 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - An optimization approach for safety instrumented system design

✍ Machleidt, Konstantin; Litz, Lothar 📂 Article 📅 2011 🏛 IEEE ⚖ 402 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Model-driven automated software FMEA

✍ Snooke, Neal; Price, Chris 📂 Article 📅 2011 🏛 IEEE ⚖ 729 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Reliability growth planning for discrete-use systems

✍ Hall, J. Brian 📂 Article 📅 2011 🏛 IEEE ⚖ 563 KB

[IEEE Integrity (RAMS) - Lake Buena Vist

[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Software reliability model with bathtub-shaped fault detection rate

✍ Fiondella, Lance; Gokhale, Swapna S. 📂 Article 📅 2011 🏛 IEEE ⚖ 383 KB