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[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - A method of quantitative analysis for dynamic fault tree

✍ Scribed by Zhang, Hong-Lin; Zhang, Chun-Yuan; Liu, Dong; Li, Rui

Book ID: 118014001
Publisher: IEEE
Year: 2011
Weight: 482 KB
Volume: 0
Category: Article
ISBN: 1424488575
DOI: 10.1109/rams.2011.5754471

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