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[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Quantifying the value of risk-mitigation measures for launch vehicles

✍ Scribed by Morse, Elisabeth L.; Fragola, Joseph R.

Book ID: 120983911
Publisher: IEEE
Year: 2011
Weight: 428 KB
Category: Article
ISBN: 1424488575
DOI: 10.1109/RAMS.2011.5754436

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