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[IEEE IEEE International Symposium on Power Semiconductor Devices and Integrated Circuits - Cambridge, UK (14-17 April 2003)] ISPSD '03. 2003 IEEE 15th International Symposium on Power Semiconductor Devices and ICs, 2003. Proceedings. - The impact of sub-threshold current on ultra high density trench MOSFET for synchronous rectifier application

✍ Scribed by Sun, N.X.; Huang, A.Q.

Book ID: 120655367
Publisher: IEEE
Year: 2003
Weight: 228 KB
Edition: 2003
Category: Article
ISBN-13: 9780780378766
DOI: 10.1109/ISPSD.2003.1225301

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