𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE IEEE International Symposium on Electrical Insulation - Toronto, Ont., Canada (3-6 June 1990)] IEEE International Symposium on Electrical Insulation - A model of solid dielectrics aging

✍ Scribed by Crine, J.-P.

Book ID: 123616261
Publisher: IEEE
Year: 1990
Weight: 185 KB
Category: Article
DOI: 10.1109/ELINSL.1990.109700

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE IEEE International Symposium on El

[IEEE IEEE International Symposium on Electrical Insulation - Toronto, Ont., Canada (3-6 June 1990)] IEEE International Symposium on Electrical Insulation - Treeing, a mechanism of breakdown in solid dielectrics

✍ Eichhorn, R.M. 📂 Article 📅 1990 🏛 IEEE ⚖ 207 KB

[IEEE IEEE International Symposium on El

[IEEE IEEE International Symposium on Electrical Insulation - Toronto, Ont., Canada (3-6 June 1990)] IEEE International Symposium on Electrical Insulation - Impurities in XLPE cables

✍ Pelissou, S. 📂 Article 📅 1990 🏛 IEEE ⚖ 378 KB

[IEEE IEEE International Symposium on El

[IEEE IEEE International Symposium on Electrical Insulation - Toronto, Ont., Canada (3-6 June 1990)] IEEE International Symposium on Electrical Insulation - A review of electrical and thermal multistress aging models

✍ Cygan, P.; Laghari, J.R. 📂 Article 📅 1990 🏛 IEEE ⚖ 654 KB

[IEEE IEEE International Symposium on El

[IEEE IEEE International Symposium on Electrical Insulation - Toronto, Ont., Canada (3-6 June 1990)] IEEE International Symposium on Electrical Insulation - Influence of pollution of HV insulators

✍ Gouda, O.E. 📂 Article 📅 1990 🏛 IEEE ⚖ 413 KB

[IEEE IEEE International Symposium on El

[IEEE IEEE International Symposium on Electrical Insulation - Toronto, Ont., Canada (3-6 June 1990)] IEEE International Symposium on Electrical Insulation - Photoconductive switch design and applications

✍ Howson, P.A.; Miller, R.; Ryder, D.M. 📂 Article 📅 1990 🏛 IEEE ⚖ 355 KB

[IEEE IEEE International Symposium on El

[IEEE IEEE International Symposium on Electrical Insulation - Toronto, Ont., Canada (3-6 June 1990)] IEEE International Symposium on Electrical Insulation - A reliability model for dielectric damage to machine windings

✍ Pierrat, L. 📂 Article 📅 1990 🏛 IEEE ⚖ 323 KB