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[IEEE IEEE International Symposium on Electrical Insulation - Toronto, Ont., Canada (3-6 June 1990)] IEEE International Symposium on Electrical Insulation - Treeing, a mechanism of breakdown in solid dielectrics

✍ Scribed by Eichhorn, R.M.

Book ID: 126604998
Publisher: IEEE
Year: 1990
Weight: 207 KB
Category: Article
DOI: 10.1109/ELINSL.1990.109695

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