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[IEEE IEEE International Symposium on Electrical Insulation - Toronto, Ont., Canada (3-6 June 1990)] IEEE International Symposium on Electrical Insulation - A review of electrical and thermal multistress aging models

✍ Scribed by Cygan, P.; Laghari, J.R.

Book ID: 127021392
Publisher: IEEE
Year: 1990
Weight: 654 KB
Category: Article
DOI: 10.1109/elinsl.1990.109698

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