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[IEEE IEEE International Symposium on Electrical Insulation - Toronto, Ont., Canada (3-6 June 1990)] IEEE International Symposium on Electrical Insulation - A reliability model for dielectric damage to machine windings

✍ Scribed by Pierrat, L.

Book ID: 115546056
Publisher: IEEE
Year: 1990
Weight: 323 KB
Volume: 0
Category: Article
DOI: 10.1109/elinsl.1990.109776

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