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[IEEE Conference Record of the 2006 IEEE International Symposium on Electrical Insulation - Toronto, ON, Canada (11-14 June 2006)] Conference Record of the 2006 IEEE International Symposium on Electrical Insulation - Partial Discharge Pattern Analysis of Modeled Insulation Defects in Transformer Insulation

✍ Scribed by Massingue, F.; Meijer, S.; Agoris, P.D.; Smit, J.J.; Lopez-Roldan, J.

Book ID: 118019567
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 518 KB
Volume: 0
Category: Article
ISBN-13: 9781424403332
DOI: 10.1109/elinsl.2006.1665376

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