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[IEEE IEEE International Integrated Reliability Workshop - Lake Tahoe, CA, USA (21-24 Oct. 2002)] IEEE International Integrated Reliability Workshop Final Report, 2002. - Real case study of SWEAT EM test on via/line structure as process reliability monitor methodology

✍ Scribed by Andrew, K.L.Y.; Bee Hoon Lim, ; Yap, H.K.; Tan, Y.C.; Lo, K.F.

Book ID: 126725519
Publisher: IEEE
Year: 2002
Weight: 189 KB
Category: Article
ISBN-13: 9780780375581
DOI: 10.1109/IRWS.2002.1194259

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