✦ LIBER ✦

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Voltage and temperature dependence of capacitance of high-k HfO/sub 2/ MIM capacitors: a unified understanding and prediction

✍ Scribed by Chunxiang Zhu, ; Hang Hu, ; Xiongfei Yu, ; Kim, S.J.; Chin, A.; Li, M.F.; Byung Jin Cho, ; Kwong, D.L.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE IEEE International Electron Device

✍ Hang Hu, ; Shi-Jin Ding, ; Lim, H.F.; Chunxiang Zhu, ; Li, M.F.; Kim, S.J.; Yu, 📂 Article 📅 2003 🏛 IEEE ⚖ 253 KB

[IEEE IEEE International Electron Device

✍ Tseng, H.-H.; Ramon, M.E.; Hebert, L.; Tobin, P.J.; Triyoso, D.; Grant, J.M.; Ji 📂 Article 📅 2003 🏛 IEEE ⚖ 230 KB

[IEEE IEEE International Electron Device

✍ Pirovano, A.; Lacaita, A.L.; Benvenuti, A.; Pellizzer, F.; Hudgens, S.; Bez, R. 📂 Article 📅 2003 🏛 IEEE ⚖ 289 KB

[IEEE IEEE International Electron Device

✍ Fossum, J.G.; Chowdhury, M.M.; Trivedi, V.P.; King, T.-J.; Choi, Y.-K.; An, J.; 📂 Article 📅 2003 🏛 IEEE ⚖ 285 KB

[IEEE IEEE International Electron Device

✍ Tiemeijer, L.F.; Havens, R.J.; de Kort, R.; Bouttement, Y.; Deixler, P.; Ryczek, 📂 Article 📅 2003 🏛 IEEE ⚖ 251 KB

[IEEE IEEE International Electron Device

✍ Samavedam, S.B.; La, L.B.; Tobin, P.J.; White, B.; Hobbs, C.; Fonseca, L.R.C.; D 📂 Article 📅 2003 🏛 IEEE ⚖ 230 KB