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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Fermi level pinning with sub-monolayer MeOx and metal gates [MOSFETs]

✍ Scribed by Samavedam, S.B.; La, L.B.; Tobin, P.J.; White, B.; Hobbs, C.; Fonseca, L.R.C.; Demkov, A.A.; Schaeffer, J.; Luckowski, E.; Martinez, A.; Raymond, M.; Triyoso, D.; Roan, D.; Dhandapani, V.; Garcia, R.; Anderson, S.G.H.; Moore, K.; Tseng, H.H.; Capasso, C.; Adetutu, O.; Gilmer, D.C.; Taylor, W.J.; Hegde, R.; Grant, J.

Book ID: 121489171
Publisher: IEEE
Year: 2003
Weight: 230 KB
Edition: 1
Category: Article
ISBN-13: 9780780378728
DOI: 10.1109/IEDM.2003.1269286

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