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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Device design considerations for ultra-thin SOI MOSFETs

✍ Scribed by Doris, B.; Ieong, M.; Zhu, T.; Zhang, Y.; Steen, M.; Natzle, W.; Callegari, S.; Narayanan, V.; Cai, J.; Ku, S.H.; Jamison, P.; Li, Y.; Ren, Z.; Ku, V.; Boyd, T.; Kanarsky, T.; D'Emic, C.; Newport, M.; Dobuzinsky, D.; Deshpande, S.; Petrus, J.; Jammy, R.; Haensch, W.

Book ID: 118182450
Publisher: IEEE
Year: 2003
Weight: 289 KB
Edition: 1
Volume: 0
Category: Article
ISBN-13: 9780780378728
DOI: 10.1109/iedm.2003.1269360

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