๐”– Bobbio Scriptorium
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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Thermal analysis of ultra-thin body device scaling [SOI and FinFet devices]

โœ Scribed by Pop, E.; Dutton, R.; Goodson, K.


Book ID
111923440
Publisher
IEEE
Year
2003
Weight
279 KB
Edition
1
Volume
0
Category
Article
ISBN-13
9780780378728

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