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[IEEE IEEE 1999 International Interconnect Technology Conference - San Francisco, CA, USA (24-26 May 1999)] Proceedings of the IEEE 1999 International Interconnect Technology Conference (Cat. No.99EX247) - Step like degradation profile of electromigration of W-plug contact

✍ Scribed by Guo Qiang, ; Lo Keng Foo, ; Zeng Xu, ; Neo Soh Ping, ; Yao Pei, ; Oh Chong Khiam,

Book ID: 127235227
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 341 KB
Edition: 1999
Category: Article
ISBN-13: 9780780351745
DOI: 10.1109/iitc.1999.787073

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