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[IEEE IEEE 1998 International Interconnect Technology Conference - San Francisco, CA, USA (1-3 June 1998)] Proceedings of the IEEE 1998 International Interconnect Technology Conference (Cat. No.98EX102) - Low-k dielectrics influence on crosstalk: electromagnetic analysis and characterization

✍ Scribed by Cregut, C.; Le Carval, G.; Chilo, J.

Book ID: 126647123
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 267 KB
Category: Article
ISBN-13: 9780780342859
DOI: 10.1109/IITC.1998.704751

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