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[IEEE IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - San Francisco, CA, USA (Dec. 13-15, 2004)] IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. - 3D GOI CMOSFETs with novel IrO/sub 2/2(Hf) dual gates and high-K dielectric on 1P6M-0.18μm-CMOS

✍ Scribed by Yu, D.S.; Chin, A.; Laio, C.C.; Lee, C.F.; Cheng, C.F.; Chen, W.J.; Zhu, C.; Li, M.-F.; Yoo, W.J.; McAlister, S.P.; Kwong, D.L.

Book ID: 127184547
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 298 KB
Category: Article
ISBN-13: 9780780386846
DOI: 10.1109/iedm.2004.1419101

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