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[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - FeRAM retention analysis method based on memory cell read signal voltage measurement

✍ Scribed by Koike, H.; Amanuma, K.; Miwa, T.; Yamada, J.; Toyoshima, H.

Book ID: 126716404
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 450 KB
Category: Article
ISBN-13: 9780780365117
DOI: 10.1109/ICMTS.2001.928634

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