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[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - A new robust on-wafer 1/f noise measurement and characterization system

✍ Scribed by Blaum, A.; Pilloud, O.; Scalea, G.; Victory, J.; Sischka, F.

Book ID: 126681766
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 509 KB
Category: Article
ISBN-13: 9780780365117
DOI: 10.1109/ICMTS.2001.928650

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