𝔖 Bobbio Scriptorium

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[IEEE High Density Design Packaging and Microsystem Integration, 2007 International Symposium on - (2007.06.26-2007.06.28)] High Density Design Packaging and Microsystem Integration, 2007 International Symposium on - Multi-phase Clock Scan Technique for Low Test Power

✍ Scribed by Zhang, Jinyi; Zhang, Tianbao; Zuo, Qinghua

Book ID: 126766545
Publisher: IEEE
Year: 2007
Weight: 311 KB
Category: Article
ISBN-13: 9781424412532
DOI: 10.1109/HDP.2007.4283629

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