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[IEEE High Density Design Packaging and Microsystem Integration, 2007 International Symposium on - (2007.06.26-2007.06.28)] High Density Design Packaging and Microsystem Integration, 2007 International Symposium on - A Study of Snapback and Parasitic Bipolar Action for ESD NMOS Modeling

✍ Scribed by Lu Jia, ; Yuxi, Jiang; Yang, Dian; Feng, Ran

Book ID: 126754697
Publisher: IEEE
Year: 2007
Weight: 381 KB
Category: Article
ISBN-13: 9781424412532
DOI: 10.1109/HDP.2007.4283641

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