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[IEEE Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - San Diego, CA, USA (10-12 Feb. 1988)] Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - Experimental thermal characterization of VLSI packages

✍ Scribed by Shope, D.A.; Fahey, W.J.; Prince, J.L.; Staszak, Z.J.

Book ID: 126769480
Publisher: IEEE
Year: 1988
Weight: 567 KB
Category: Article
DOI: 10.1109/SEMTHE.1988.10592

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