𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - San Diego, CA, USA (10-12 Feb. 1988)] Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - Factors affecting semiconductor device thermal resistance measurements

✍ Scribed by Siegal, B.S.

Book ID: 123615560
Publisher: IEEE
Year: 1988
Weight: 527 KB
Category: Article
DOI: 10.1109/SEMTHE.1988.10591

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE Fourth Annual IEEE Semiconductor T

[IEEE Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - San Diego, CA, USA (10-12 Feb. 1988)] Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - Experimental thermal characterization of VLSI packages

✍ Shope, D.A.; Fahey, W.J.; Prince, J.L.; Staszak, Z.J. 📂 Article 📅 1988 🏛 IEEE ⚖ 567 KB

[IEEE Fourth Annual IEEE Semiconductor T

[IEEE Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - San Diego, CA, USA (10-12 Feb. 1988)] Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - Low speed wind tunnel testing

✍ Boyle, M.T. 📂 Article 📅 1988 🏛 IEEE ⚖ 799 KB

[IEEE Fourth Annual IEEE Semiconductor T

[IEEE Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - San Diego, CA, USA (10-12 Feb. 1988)] Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - Package thermal resistance model dependency on equipment design

✍ Andrews, J.A. 📂 Article 📅 1988 🏛 IEEE ⚖ 728 KB

[IEEE Fourth Annual IEEE Semiconductor T

[IEEE Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - San Diego, CA, USA (10-12 Feb. 1988)] Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - A review of thermal characterization of power transistors

✍ Blackburn, D.L. 📂 Article 📅 1988 🏛 IEEE ⚖ 757 KB

[IEEE Fourth Annual IEEE Semiconductor T

[IEEE Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - San Diego, CA, USA (10-12 Feb. 1988)] Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - Effects of radiation on enhanced electronic cooling

✍ Buller, L.; McNelis, B. 📂 Article 📅 1988 🏛 IEEE ⚖ 585 KB

[IEEE Fourth Annual IEEE Semiconductor T

[IEEE Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - San Diego, CA, USA (10-12 Feb. 1988)] Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - Statistical analysis of power module thermal test equipment performance

✍ Houf, R.E.; Berman, D.B. 📂 Article 📅 1988 🏛 IEEE ⚖ 331 KB