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[IEEE Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - San Diego, CA, USA (10-12 Feb. 1988)] Fourth Annual IEEE Semiconductor Thermal and Temperature Measurement Symposium - A review of thermal characterization of power transistors

✍ Scribed by Blackburn, D.L.

Book ID: 121330620
Publisher: IEEE
Year: 1988
Weight: 757 KB
Category: Article
DOI: 10.1109/SEMTHE.1988.10589

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