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[IEEE Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. SEMI-THERM. 1999 - San Diego, CA, USA (9-11 March 1999)] Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.99CH36306) - Measurements of adhesive bondline effective thermal conductivity and thermal resistance using the laser flash method

✍ Scribed by Campbell, R.C.; Smith, S.E.; Dietz, R.L.

Book ID: 120195266
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 1005 KB
Edition: 1999
Category: Article
ISBN-13: 9780780352643
DOI: 10.1109/STHERM.1999.762433

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