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[IEEE Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. SEMI-THERM. 1999 - San Diego, CA, USA (9-11 March 1999)] Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.99CH36306) - New way for thermal transient testing [IC packaging]

✍ Scribed by Szekely, V.; Rencz, M.; Poppe, A.; Courtois, B.

Book ID: 126757613
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 571 KB
Edition: 1999
Category: Article
ISBN-13: 9780780352643
DOI: 10.1109/STHERM.1999.762446

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