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[IEEE Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. SEMI-THERM. 1999 - San Diego, CA, USA (9-11 March 1999)] Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.99CH36306) - Thermal parameter estimation in the presence of uncertainty [packaging]

✍ Scribed by Emery, A.F.

Book ID: 126685106
Publisher: IEEE
Year: 1999
Weight: 303 KB
Category: Article
ISBN-13: 9780780352643
DOI: 10.1109/STHERM.1999.762425

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