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[IEEE Exhibition - Singapore (2008.05.19-2008.05.23)] 2008 Asia-Pacific Symposium on Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility - Application of GTEM cells for IC EMC testing

✍ Scribed by Heinrich, Ralf; Mullerwiebus, Viki; Lange, Andreas; Deutschmann, Bernd; Karsten, Uwe; Klotz, Frank

Book ID: 126768180
Publisher: IEEE
Year: 2008
Weight: 281 KB
Category: Article
DOI: 10.1109/APEMC.2008.4559862

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