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[IEEE Exhibition - Singapore (2008.05.19-2008.05.23)] 2008 Asia-Pacific Symposium on Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility - Electromagnetic compatibility modeling techniques: Past, present and future

✍ Scribed by Ruehli, Albert E.; Miersch, Ekkehard

Book ID: 127268847
Publisher: IEEE
Year: 2008
Weight: 111 KB
Category: Article
DOI: 10.1109/apemc.2008.4559796

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