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[IEEE Exhibition - Singapore (2008.05.19-2008.05.23)] 2008 Asia-Pacific Symposium on Electromagnetic Compatibility and 19th International Zurich Symposium on Electromagnetic Compatibility - Experience with the RMS-Average detector

✍ Scribed by Medler, Jens

Book ID: 120042353
Publisher: IEEE
Year: 2008
Weight: 271 KB
Category: Article
DOI: 10.1109/APEMC.2008.4559870

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